Category exptl
Category Description
Data items in the EXPTL category record details about the
experimental work prior to the intensity measurements and
details about the absorption-correction technique employed.
Category Examples
Example 1:
Example 1 - based on laboratory records for Yb(S-C5H4N)2(THF)4.
_exptl.entry_id datablock1
_exptl.absorpt_coefficient_mu 1.22
_exptl.absorpt_correction_T_max 0.896
_exptl.absorpt_correction_T_min 0.802
_exptl.absorpt_correction_type integration
_exptl.absorpt_process_details
; Gaussian grid method from SHELX76
Sheldrick, G. M., "SHELX-76: structure determination and
refinement program", Cambridge University, UK, 1976
;
_exptl.crystals_number 1
_exptl.details
; Enraf-Nonius LT2 liquid nitrogen variable-temperature
device used
;
_exptl.method 'single-crystal x-ray diffraction'
_exptl.method_details
; graphite monochromatized Cu K(alpha) fixed tube and
Enraf-Nonius CAD4 diffractometer used
;
Key Category Items
Items in Category exptl
